ECT´s new LFRE, Lead Free Test Probe line,

incorporates a number of features that will significantly reduce the issues that arise when switching to lead free solder as well as those contact issues that arise with OSP and No-Clean solder flux.More General Probe Information.

• New Proprietary Plating ( Our new Lead Free probe incorporates a new Harder and Slicker plating that not only resists wear but  also reduces solder and debris transfer.)
  
  

Higher Preload (All of our new Lead Free probes incorporate higher preloads. Higher preload reduces spring force variation with board flex and increases the initial impact penetration, resulting in higher first pass yields.)

PogoPlus Bias Ball Design (The PogoPlus internal bias ball design guarantees uninterrupted electrical contact with the probe sidewall virtually eliminating probe related false opens.)

Range of Spring Force Choices: (Compared to competitors’ products, which offer limited spring force options, ECT’s LFRE Pogos are available in a variety of spring force choices in 100 mil, 75 mil and 50 mil centers.)

Spring Life (All of ECT’s Lead Free (LFRE) probes have a spring fatigue life that surpasses 500,000 cycles. Competitors’ lead free products may increase preload but dramatically lower cycle life, in some cases, at or below 50,000 cycles.

Pointing Accuracy ECT’s new Lead Free probe incorporates a double roll close, which offers the industries best pointing accuracy. Increased pointing accuracy is of benefit when using Lead Free solder and/or No-Clean as the probe is less likely to touch the edge of the pad where the solder flux accumulates.

The PogoPlus® is also designed to be the world’s most durable probe with features  like optional stainless-steel MicroSharp™ tips, a larger spring volume and enhanced pointing precision.

LFRE plated probes from Everett Charles Technologies consistently outperform traditional Gold plated probes. LFRE plated probes provide customers with a proven high volume production test solution for lead free PCBA test applications.  They ensure reliable contact and longer life for probes in in-circuit test fixtures. In addition to improved tip ware, LFRE plated probes are less prone to solder transfer.

Besides the leading expertise in materials and platings, probes for lead free applications leverage ECT’s probe design and fabrication knowledge. The LFRE plated probes incorporate ECT’s proven PogoPlus® bias ball design and double roll close process.  Both of which contribute to making sustainable reliable contact to PCB targets. Lead free plating is featured on ECT’s industry standard PogoPlus® LFRE series, Metrix™, and on Long Travel probes.

More Information on the LFRE range of Test Probes;

1. Available Tip Styles and Test Centers -72 (.050 / 1,27mm) -1 (.075 / 1,91mm) -25 (.100 / 2,54mm), see Picture below.
2. Goto the download page for more information by clicking the picture.

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